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Automated Testing for High-Speed Digital Standards (Boot Camp)
Lesson 6 - DDR5 Memory Simulation and Analysis

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Lesson 6 - DDR5 Memory Simulation and Analysis

Published Date July 15, 2022

Previous Lesson

Lesson 5 - USB Type-C Design Simulation & Automated Testing

Learn how USB4 and other standards achieve faster data rates for connecting consumer devices, as well as the challenges of designing and testing USB Type-C devices.
Next Lesson

Lesson 7 - Ethernet Standards Overview and Testing Challenges

Learn about the latest networking specifications from IEEE and OIF-CEI and how to solve the challenges that developers may encounter when designing at 200 Gbps/lane speeds.

Additional Course Resources

9 months ago
Lesson 1 - How Emerging Technology Drives New Digital Data Standards

5G, autonomous driving, and other technologies push the boundaries of data center infrastructure. The digital data standards that they run on are getting faster to meet the demand.

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9 months ago
Lesson 2 - PCIe 6.0 Technology Overview and Test Challenges

The PCIe 6.0 spec is arriving to double the data rate of PCIe 5.0. Learn some of the benefits and challenges of the new standard.

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9 months ago
Lesson 3 - PCIe Technology – Designing for Signal Integrity

PCIe 6.0 introduces several potential physical layer challenges. Learn to design and test PCIe channels for signal integrity with Keysight's Physical Layer Test System software.

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9 months ago
Lesson 4 - PCIe Technology - Design Simulation

Learn how automated design software can be used to model the PCIe 6.0 channel, transmitters, and receivers, ensuring your device or system meets spec while still in simulation.

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9 months ago
Lesson 5 - USB Type-C Design Simulation & Automated Testing

Learn how USB4 and other standards achieve faster data rates for connecting consumer devices, as well as the challenges of designing and testing USB Type-C devices.

View Course
9 months ago
Lesson 7 - Ethernet Standards Overview and Testing Challenges

Learn about the latest networking specifications from IEEE and OIF-CEI and how to solve the challenges that developers may encounter when designing at 200 Gbps/lane speeds.

View Course
9 months ago
Lesson 8 - Ethernet – Noise and Jitter Measurements

Learn how noise and jitter affect vertical eye closure, how the type of oscilloscope you use affects your measurements, and how the IEEE 802.3ck addresses these impairments.

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9 months ago
Lesson 9 - Ethernet - Solving Frame Loss with Forward Error Correction

Learn how to lower bit error rates in PAM-4 communications using forward error correction and how to solve issues such as frame loss from burst errors.

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8 months ago
Digital Design and Interconnect Standards

https://learn.keysight.com/i/1474415-digital-design-and-interconnect-standards

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8 months ago
5th Generation High-Speed Digital Designs Considerations

https://learn.keysight.com/i/1474414-5th-generation-high-speed-digital-designs-considerations

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8 months ago
High-Performance Digital Products Catalog

https://learn.keysight.com/i/1474411-high-performance-digital-products-catalog

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8 months ago
PathWave Design and Test Software Catalog

https://learn.keysight.com/i/1474409-pathwave-design-and-test-software-catalog

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8 months ago
How to Test and Troubleshoot USB4

https://learn.keysight.com/i/1474407-how-to-test-and-troubleshoot-usb4

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8 months ago
The Evolution of PCIe® Standards and Test Requirements

https://learn.keysight.com/i/1474406-the-evolution-of-pcie-standards-and-test-requirements

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8 months ago
Data Center Ethernet Technology and Evolution to 224 Gbps

https://learn.keysight.com/i/1474403-data-center-ethernet-technology-and-evolution-to-224-gbps

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